Atomic Force Microscope (AFM)
The atomic force microscope (AFM) is designed to measure local properties, such as height, friction and magnetism, with a sharp tip probe. To acquire an image, the AFM raster scans the probe over a small area of the sample, measuring the local property simultaneously.
Applications
- Analysis of Nanostructures and the morphology of various materials
- Imaging of DNA, RNA and …
- Measuring the smoothness of optical surfaces
- Introducing the basics of nanotechnology applied to biosciences and engineering
- Introducing the fundamentals of nano-scale imaging
- Introducing nano-bio samples, carbon nanotubes, etc.
Special Features
- Ease of installing the head and simple dismantling, within the students’ capabilities
- Simply picking the spot for scanning
- Controllable scan rate, scanning range, scanning angle and the coefficients
- Working under non-vacuum conditions
- Reasonable price and low energy consumption
- No restrictions on the type of sample unlike STM, TEM and SEM
Technical Specifications
- Scanning range: 50 µm
- Sample travel range: 7 mm
- Sample surface roughness: up to 5 µm
- Sample Thickness: up to 5mm
- Sample dimensions: up to 10 × 10 mm