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Equipment

Scanning Probe Microscope (SPM)

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded with the invention of the scanning tunneling microscope in 1981.

Applications

  • Atomic-scale imaging of solid surfaces
  • Research on catalytic agents
  • Surface imaging of conductive and semi-conductive surfaces
  • Imaging of DNA, RNA and …
  • Measuring the smoothness of optical surfaces
  • Determining the magnetic and electric properties

Special Features

  • Imaging based on atomic force
  • Camera view for both sample and cantilever and /tip (in STM mode)
  • Anti-vibration table with damper
  • Simultaneous readouts of topography and phase domain for both semi- and non-contact materials
  • Electronic ON and OFF switch for camera

Technical Specifications

    AFM mode:
  • Maximum Z-range: 5 µm
  • Z direction resolution: 0.07 nm
  • XY direction resolution: 0.25 nm
  • Imaging modes: contact (fixed height and force) and semi-contact and non-contact
    STM mode:
  • Maximum Z-range: 5 µm
  • Maximum XY-range: 20 µm
  • Z direction resolution: 0.07 nm
  • XY direction resolution: 0.25 nm
  • Motorized sample movement
  • Imaging modes: constant current, constant height