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Package 7: Nanomaterials Characterization Techniques

The characterization and investigation of properties of nanomaterials is essential for studying nanostructured materials. Hence, many characteristic and new properties of nanomaterials should be measured in accurate and high precision method. Scanning probe microscopy and spectroscopy methods are provided in TAVANA Educational Nano Lab to study nanomaterials accurately. Also, some innovative and simple methods are proposed to measure the mechanical properties of nanomaterials.

Instruments list: Atomic Force Microscope (AFM), Scanning Probe Microscope (SPM), Scanning Tunneling Microscope (STM), UV-vis Spectrophotometer